Monte Carlo methods

Statistical measurements and Monte-Carlo simulations of DCR in SPADs
Dark Count Rate (DCR) in 3D-stacked CMOS Single-Photon Avalanche Diode (SPAD) is investigated by means of measurements and simulations …
Mathieu Sicre, Megan Agnew, Christel Buj, Caroline Coutier, Dominique Golanski, Rémi Helleboid, Bastien Mamdy, Isobel Nicholson, Sara Pellegrini, Denis Rideau, David Roy, Francis Calmon
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Single Photon Avalanche Diode with Monte Carlo Simulations: PDE, Jitter and Quench Probability
Single Photon Avalanche Diodes (SPAD) are key optoelectronic detectors for medical imaging, camera ranging and automotive laser imaging …
D. Rideau, Y. Oussaiti, J. Grebot, Rémi Helleboid, A. Lopez, G. Mugny, E. Bourreau, D. Golanski, B. Mamdy, H. Wehbe Alause, I. Nicholson, S. Pellegrini, C.E. Vlimant, M. Agnew, T. Cazimajou, M. Pala, J. Saint-Martin, P. Dollfus
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Quenching Statistics of Silicon Single Photon Avalanche Diodes
The statistical behavior of silicon-based single-photon-avalanche-diodes (SPADs) is investigated by using self-consistent 3-D Monte …
Thibauld Cazimajou, Marco Pala, Jérôme Saint-Martin, Rémi Helleboid, Jérémy Grebot, Denis Rideau, Philippe Dollfus
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