defects

Statistical measurements and Monte-Carlo simulations of DCR in SPADs
Dark Count Rate (DCR) in 3D-stacked CMOS Single-Photon Avalanche Diode (SPAD) is investigated by means of measurements and simulations …
Mathieu Sicre, Megan Agnew, Christel Buj, Caroline Coutier, Dominique Golanski, Rémi Helleboid, Bastien Mamdy, Isobel Nicholson, Sara Pellegrini, Denis Rideau, David Roy, Francis Calmon
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Dark Count Rate in Single-Photon Avalanche Diodes: Characterization and Modeling study
Dark Count Rate (DCR) in Single-Photon Avalanche Diodes (SPAD) in Complementary Metal-Oxide Semiconductor technology is characterized …
Mathieu Sicre, Megan Agnew, Christel Buj, Jean Coignus, Dominique Golanski, Rémi Helleboid, Bastien Mamdy, Isobel Nicholson, Sara Pellegrini, Denis Rideau, David Roy, Francis Calmon
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