Computational modeling

Statistical measurements and Monte-Carlo simulations of DCR in SPADs
Dark Count Rate (DCR) in 3D-stacked CMOS Single-Photon Avalanche Diode (SPAD) is investigated by means of measurements and simulations …
Mathieu Sicre, Megan Agnew, Christel Buj, Caroline Coutier, Dominique Golanski, Rémi Helleboid, Bastien Mamdy, Isobel Nicholson, Sara Pellegrini, Denis Rideau, David Roy, Francis Calmon
Cite DOI
Comprehensive Modeling and Characterization of Photon Detection Efficiency and Jitter Tail in Advanced SPAD Devices
A new method to reliably simulate the PDE and jitter tail for realistic three-dimensional SPAD devices is presented. The simulation …
Rémi Helleboid, Denis Rideau, Jérémy Grebot, Isobel Nicholson, Norbert Moussy, Olivier Saxod, Marie Basset, Antonin Zimmer, Bastien Mamdy, Dominique Golanski, Megan Agnew, Sara Pellegrini, Mathieu Sicre, Christel Buj, Guillaume Marchand, Jérôme Saint-Martin, Marco Pala, Philippe Dollfus
Cite DOI
Dark Count Rate in Single-Photon Avalanche Diodes: Characterization and Modeling study
Dark Count Rate (DCR) in Single-Photon Avalanche Diodes (SPAD) in Complementary Metal-Oxide Semiconductor technology is characterized …
Mathieu Sicre, Megan Agnew, Christel Buj, Jean Coignus, Dominique Golanski, Rémi Helleboid, Bastien Mamdy, Isobel Nicholson, Sara Pellegrini, Denis Rideau, David Roy, Francis Calmon
Cite DOI
Semi-Empirical model for optical properties of $textSi_1-xtextGe_x$ alloys accounting for strain and temperature
A semi-empirical model for the optical properties of SiGe alloys is proposed, based on physical considerations and the summation of …
Jérémy Grebot, Gabriel Mugny, Rémi Helleboid, Isobel Nicholson, Francesco Abbate, Denis Rideau, Hélène Wehbe-Alause, Claire Scheid, Stéphane Lanteri
Cite DOI
Quenching Statistics of Silicon Single Photon Avalanche Diodes
The statistical behavior of silicon-based single-photon-avalanche-diodes (SPADs) is investigated by using self-consistent 3-D Monte …
Thibauld Cazimajou, Marco Pala, Jérôme Saint-Martin, Rémi Helleboid, Jérémy Grebot, Denis Rideau, Philippe Dollfus
Cite DOI