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Multiscale SPAD modeling: from Monte Carlo to SPICE simulations
We present a study of the main SPAD figures of merit using a multiscale approach, from Monte Carlo simulations to SPICE simulations. We …
Statistical measurements and Monte-Carlo simulations of DCR in SPADs
Dark Count Rate (DCR) in 3D-stacked CMOS Single-Photon Avalanche Diode (SPAD) is investigated by means of measurements and simulations …
Comprehensive modeling and characterization of Photon Detection Efficiency and Jitter in advanced SPAD devices
This paper presents a new method to reliably simulate the PDE and jitter for realistic 3D device simulations of SPAD devices. This …
Dark Count Rate in Single-Photon Avalanche Diodes: Characterization and Modeling study
Dark Count Rate (DCR) in Single-Photon Avalanche Diodes (SPAD) in Complementary Metal-Oxide Semiconductor technology is characterized …
Single Photon Avalanche Diode with Monte Carlo Simulations: PDE, Jitter and Quench Probability
Single Photon Avalanche Diodes (SPAD) are key optoelectronic detectors for medical imaging, camera ranging and automotive laser imaging …